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Tipevaluation software provides on-command "worst case" probeshape diagnosis based on scanning of this roughness sample
16026-10 SDS (109KB PDF)
Extra Fine Point
A pack of 10 High quality etched silicon probes for soft TappingMode™ and other non-contact modes
SAPPHIRE-12M
SEM Magnification Standard and Stage Micrometer MRS-4 - Retainer for MRS-4 13kHz Tipevaluation software provides on-command "worstDESCRIPTION Protective Retainer for MRS 3 4, SEM, 1" x 0. 125" (25. 4 x 3. 18mm) with clear hole for transmission measurements. Standard recessed 0. 02" (0. 5mm) The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies
